发明名称 分析装置、センサの検査装置、検査方法、及び検査プログラム
摘要 There is provided a sensor testing method including: applying at least one of a first voltage that obtains a response caused by a substance and a second voltage that either obtains no response or substantially no response caused by the substance across a first electrode and a second electrode of a sensor; measuring current flowing between the first electrode and the second electrode; and determining whether or not there is a defect present in the sensor based on a quantity related to an amount of change per specific period of time of a current measured when the first voltage and/or the second voltage have been applied.
申请公布号 JP5819183(B2) 申请公布日期 2015.11.18
申请号 JP20110286060 申请日期 2011.12.27
申请人 发明人
分类号 A61B5/1473;A61B5/1486;G01N27/26;G01N27/30;G01N27/416 主分类号 A61B5/1473
代理机构 代理人
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