| 摘要 |
For spatial high resolution imaging of a structure of a sample, the structure comprising a luminophore, the sample, in a measurement area, is subjected to an intensity distribution of luminescence inhibiting light comprising a local minimum. Then, the sample, in the measurement area, is subjected to luminescence excitation light which excites the luminophore out of an electronic ground state into a luminescent state, and luminescence light emitted out of the measurement area is registered. This registered luminescence light is assigned to the position of the local minimum within the sample. The luminescence inhibiting light disturbs the electronic ground state of the luminophore such that the luminophore, in the disturbed electronic ground state, has an absorption cross-section for the luminescence excitation light which is reduced by at least 50% as compared to the undisturbed electronic ground state. |
