发明名称 サンプルホルダ
摘要 The invention provides a sample holder, which can improve film thickness and distribution of a film formed on a substrate in a film forming and processing step by means of a plasma chemical vapor deposition method. The sample holder is stored in a plasma processing apparatus and is arranged at a position opposite to an electrode in the shape of comb teeth and is provided with a loading face extending along a direction vertical to the loading area of the substrate defining a loading and processing object. The corner part of the outer edge of the loading face undergoes C cornering or R cornering.
申请公布号 JP5817646(B2) 申请公布日期 2015.11.18
申请号 JP20120121581 申请日期 2012.05.29
申请人 株式会社島津製作所 发明人 今井 大輔;猿渡 哲也;三科 健
分类号 C23C16/458;H01L21/31 主分类号 C23C16/458
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