发明名称 APPARATUS AND METHOD FOR CHARACTERIZING A REPLICA TAPE
摘要 An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.
申请公布号 EP2943741(A1) 申请公布日期 2015.11.18
申请号 EP20140737631 申请日期 2014.01.09
申请人 DEFELSKO CORPORATION 发明人 VANDERVALK, LEON;STACHNIK, ROBERT V.;DAVIS, JAMES EDWARD
分类号 G01B11/06;G01N21/59 主分类号 G01B11/06
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