发明名称 Optical interferometric sensors for measuring electromagnetic fields
摘要 A method of measuring an electromagnetic field in a formation can include installing an electromagnetic sensor with improved sensitivity, the sensor including multiple optical waveguides and respective multiple materials, and in response to exposure to the electromagnetic field, the materials changing shape in opposite directions. A well system can include an optical electromagnetic sensor which measures an electromagnetic field in a formation, and wherein optical path lengths or phases in optical waveguides of the sensor change both positively and negatively in response to exposure to the electromagnetic field. A method of monitoring a formation can include installing an optical electromagnetic sensor in a wellbore which penetrates the formation, and an optical path length/phase in an optical waveguide of the sensor increasing in response to exposure to the electromagnetic field, and an optical path length/phase in another optical waveguide of the sensor decreasing in response to exposure to the electromagnetic field.
申请公布号 US9188694(B2) 申请公布日期 2015.11.17
申请号 US201213679940 申请日期 2012.11.16
申请人 Halliburton Energy Services, Inc. 发明人 Jaaskelainen Mikko;Mandviwala Tasneem A.
分类号 G01V3/26;G01R33/032 主分类号 G01V3/26
代理机构 Tumey L.L.P. 代理人 Brown Scott;Tumey L.L.P.
主权项 1. A method of monitoring a subterranean earth formation, the method comprising: installing at least one electromagnetic sensor in a well. the sensor being part of an interferometer selected from the group consisting of a Mach Zehnder interferometer and a Michelson interferometer, the sensor comprising first and second optical waveguides and respective first and second materials; inducing a first electromagnetic field in the subterranean earth formation at a first point in time; in response to exposure to the first electromagnetic field, the first and second materials changing shape, thereby increasing a first optical path length in the first optical waveguide and decreasing a second optical path length in the second optical waveguide; recording a first response of the at least one electromagnetic sensor to the first electromagnetic field; inducing a second electromagnetic field in the subterranean earth formation at a second point in time; in response to exposure to the second electromagnetic field, the first and second materials changing shape, thereby increasing the first optical path length in the first optical waveguide and decreasing the second optical path length in the second optical waveguide; recording a second response of the at least one electromagnetic sensor to the second electromagnetic field; and comparing the first response and the second response to monitor one or more changes in the subterranean earth formation.
地址 Houston TX US