发明名称 |
Double data rate counter, and analog-digital converting apparatus and CMOS image sensor using the same |
摘要 |
A double data rate (DDR) counter includes a clock selection unit suitable for selectively inverting a first counting clock based on a control signal and for outputting a second counting clock, a first latch stage suitable for latching the second counting clock based on a counting enable signal and for outputting the least significant bit (LSB) of the DDR counter, a determination unit suitable for generating the control signal based on the last bit state of the LSB in a reset counting period, and a second latch stage suitable for receiving the LSB as a clock input to generate a higher bit of the LSB at least in a main counting period. |
申请公布号 |
US9191011(B2) |
申请公布日期 |
2015.11.17 |
申请号 |
US201314052313 |
申请日期 |
2013.10.11 |
申请人 |
SK Hynix Inc. |
发明人 |
Hwang Won-Seok |
分类号 |
H03M1/56;H03K21/02;H04N5/378;H03K21/38;H03M1/12 |
主分类号 |
H03M1/56 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A double data rate (DDR) counter comprising:
a clock selection unit suitable for selectively inverting a first counting clock based on a control signal and for outputting a second counting clock; a first latch stage suitable for latching the second counting clock based on a counting enable signal and for outputting the least significant bit (LSB) of the DDR counter; a determination unit suitable for generating the control signal based on the last bit state of the LSB in a reset counting period; and a second latch stage suitable for receiving the LSB as a clock input to generate a higher bit of the LSB at least in a main counting period. |
地址 |
Gyeonggi-do KR |