发明名称 半導体装置
摘要 <p>In a semiconductor device having a built-in Schottky barrier diode as a reflux diode, a maximum unipolar current is increased in a reflux state and a leakage current is reduced in an OFF state. A Schottky electrode is provided in at least a part of a surface between adjacent well regions of a second conductivity type disposed on a surface layer side of a drift layer of a first conductivity type, and an impurity concentration of a first conductivity type in a first region provided in a lower part of the Schottky electrode and provided between the adjacent well regions is set to be higher than a first impurity concentration of a first conductivity type in the drift layer and to be lower than a second impurity concentration of a second conductivity type in the well region.</p>
申请公布号 JP5815882(B2) 申请公布日期 2015.11.17
申请号 JP20140534155 申请日期 2013.04.11
申请人 三菱電機株式会社 发明人 日野 史郎;三浦 成久;今泉 昌之
分类号 H01L27/04;H01L21/28;H01L21/336;H01L21/8234;H01L27/06;H01L29/12;H01L29/417;H01L29/423;H01L29/47;H01L29/49;H01L29/78;H01L29/872 主分类号 H01L27/04
代理机构 代理人
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