发明名称 |
Semiconductor memory device |
摘要 |
According to one embodiment, a semiconductor includes a memory cell, a bit line, a word line, a sense amplifier, and a control circuit. The memory cell stores n levels (where n is a natural number of two or greater). The control circuit controls potentials of the word line and the bit line. In a read of k−1 levels (k≦n) stored in the memory cell, the control circuit, upon applying a given voltage to the word line, determines read data based on first data corresponding to the voltage of the bit line read at a first timing by the sense amplifier and second data corresponding to the voltage of the bit line read, by the sense amplifier, at a second timing different from the first timing. |
申请公布号 |
US9190161(B2) |
申请公布日期 |
2015.11.17 |
申请号 |
US201314023187 |
申请日期 |
2013.09.10 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Shibata Noboru |
分类号 |
G11C11/34;G11C16/26;G11C11/56;G11C16/04 |
主分类号 |
G11C11/34 |
代理机构 |
Holtz, Holtz, Goodman & Chick PC |
代理人 |
Holtz, Holtz, Goodman & Chick PC |
主权项 |
1. A semiconductor memory device comprising:
a memory cell configured to stores n levels, where n is a natural number of two or greater, a bit line connected to the memory cell; a word line connected to the memory cell; a sense amplifier connected to the bit line to detect a voltage of the bit line; and a control circuit configured to control potentials of the word line and the bit line, wherein, in a read of k−1 levels stored in the memory cell, the control circuit, upon applying a given voltage to the word line, determines read data based on a first data corresponding to the voltage of the bit line read at a first timing by the sense amplifier and a second data corresponding to the voltage of the bit line read, by the sense amplifier, at a second timing different from the first timing, where k is a natural number, and k≦n. |
地址 |
Tokyo JP |