发明名称 AlN single crystal Schottky barrier diode and method of producing the same
摘要 An AlN single crystal Schottky barrier diode including: an AlN single crystal substrate having a defect density of 106 cm−2 or less and a thickness of 300 μm or more; a first electrode formed on one surface of the AlN single crystal substrate; and a second electrode formed on one surface of the AlN single crystal substrate while being spaced apart from the first electrode, the AlN single crystal Schottky barrier diode being provided with: a rectifying property such that an on-off ratio at the time of applying 10 V and −40 V is at least 103 even at a high temperature of 573 K; a high voltage resistance such that a voltage can be applied at least within a range of −40 V to 10 V; and a low on-resistance characteristic such that a current begins to flow at no greater than 5 V.
申请公布号 US9190483(B2) 申请公布日期 2015.11.17
申请号 US201314374331 申请日期 2013.01.30
申请人 NATIONAL INSTITUTE FOR MATERIALS SCIENCE 发明人 Irokawa Yoshihiro;Shimamura Kiyoshi;Garcia Villora Encarnacion Antonia
分类号 H01L29/20;H01L29/872;H01L29/66;H01L29/45;H01L29/47 主分类号 H01L29/20
代理机构 Drinker Biddle & Reath LLP 代理人 Drinker Biddle & Reath LLP
主权项 1. An AlN single crystal Schottky barrier diode comprising: an AlN single crystal substrate having a defect density of 106 cm−2 or less and a thickness of 300 μm or more; a first electrode formed on one surface of the AlN single crystal substrate; and a second electrode formed on one surface of the AlN single crystal substrate while being spaced apart from the first electrode.
地址 Tsukuba-shi, Ibaraki JP