发明名称 METHOD FOR MANUFACTURING OF A SEMICONDUCTOR DEVICE
摘要 A method for manufacturing a semiconductor device performs plasma heat treatment while providing gas for adjusting a threshold voltage to at least a part of a substrate to form a fixed charge area having fixed charges on a surface of the substrate. In addition, at least one MOS transistor is formed on the substrate having the fixed charge area. A threshold voltage of the MOS transistor is easily adjusted by the method for manufacturing a semiconductor device.
申请公布号 KR20150127448(A) 申请公布日期 2015.11.17
申请号 KR20140054281 申请日期 2014.05.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, KEUN HWI;KIM, DONG WON;HARADA YOSHINAO;KANG, MYUNG GIL;PARK, JAE YOUNG
分类号 H01L21/335;H01L21/205;H01L21/324 主分类号 H01L21/335
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