发明名称 |
METHOD FOR MANUFACTURING OF A SEMICONDUCTOR DEVICE |
摘要 |
A method for manufacturing a semiconductor device performs plasma heat treatment while providing gas for adjusting a threshold voltage to at least a part of a substrate to form a fixed charge area having fixed charges on a surface of the substrate. In addition, at least one MOS transistor is formed on the substrate having the fixed charge area. A threshold voltage of the MOS transistor is easily adjusted by the method for manufacturing a semiconductor device. |
申请公布号 |
KR20150127448(A) |
申请公布日期 |
2015.11.17 |
申请号 |
KR20140054281 |
申请日期 |
2014.05.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, KEUN HWI;KIM, DONG WON;HARADA YOSHINAO;KANG, MYUNG GIL;PARK, JAE YOUNG |
分类号 |
H01L21/335;H01L21/205;H01L21/324 |
主分类号 |
H01L21/335 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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