发明名称 Photodiode and photodiode array
摘要 A p− type semiconductor substrate 20 has a first principal surface 20a and a second principal surface 20b opposed to each other and includes a photosensitive region 21. The photosensitive region 21 is composed of an n+ type impurity region 23, a p+ type impurity region 25, and a region to be depleted with application of a bias voltage in the p− type semiconductor substrate 20. An irregular asperity 10 is formed in the second principal surface 20b of the p− type semiconductor substrate 20. An accumulation layer 37 is formed on the second principal surface 20b side of the p− type semiconductor substrate 20 and a region in the accumulation layer 37 opposed to the photosensitive region 21 is optically exposed.
申请公布号 US9190551(B2) 申请公布日期 2015.11.17
申请号 US201013202244 申请日期 2010.02.15
申请人 HAMAMATSU PHOTONICS K.K. 发明人 Yamamura Kazuhisa;Sakamoto Akira;Nagano Terumasa;Ishikawa Yoshitaka;Kawai Satoshi
分类号 H01L33/22;H01L31/107;H01L27/144;H01L31/0236;H01L31/18;H01L27/146 主分类号 H01L33/22
代理机构 Drinker Biddle & Reath LLP 代理人 Drinker Biddle & Reath LLP
主权项 1. A photodiode comprising: a silicon substrate comprised of a semiconductor of a first conductivity type and having a first principal surface and a second principal surface opposed to each other, wherein an avalanche photodiode composed of a pn junction between a semiconductor region of the first conductivity type having a higher impurity concentration than the silicon substrate and a semiconductor region of a second conductivity type is arranged on a first principal surface side of the silicon substrate, wherein on a second principal surface side of the silicon substrate, an accumulation layer of the first conductivity type having a higher impurity concentration than the silicon substrate is formed and an irregular asperity is formed in at least a region opposed to the avalanche photodiode, wherein the region opposed to the avalanche photodiode in the second principal surface of the silicon substrate is optically exposed, and wherein the first principal surface constitutes a light incident surface, light incident from the first principal surface travels in the silicon substrate, the photodiode being a front-illuminated type.
地址 Hamamatsu-shi, Shizuoka JP