发明名称 Method for fabricating semiconductor device having magnetic tunnel junction layer patterned using etching gas containing oxygen
摘要 In a method for fabricating a semiconductor device, a conductive layer is formed on a substrate, where the substrate has a bottom layer formed thereon. A magnetic tunnel junction layer is formed on the conductive layer. The magnetic tunnel junction layer is patterned using an etching gas containing oxygen. An insulating layer is formed by oxidizing the conductive layer exposed outside the patterned magnetic tunnel junction layer using the etching gas.
申请公布号 US9190608(B2) 申请公布日期 2015.11.17
申请号 US201414581554 申请日期 2014.12.23
申请人 SK Hynix Inc. 发明人 Lee Min Suk;Jung Bo Kyoung
分类号 H01L21/00;H01L43/12;H01L43/08;H01L43/10 主分类号 H01L21/00
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A method for fabricating a semiconductor device, the method comprising: forming an insulating layer between the substrate and bottom layer; forming a hole penetrating the insulating layer; forming a contact plug inside the hole; forming a conducting pattern on the contact plug and inside the hole; forming a conductive layer on the substrate having the bottom layer; forming a magnetic tunnel junction layer on the conductive layer; patterning the magnetic tunnel junction layer using an etching gas containing oxygen; and forming an insulating layer by oxidizing the conductive layer, which is exposed outside the patterned magnetic tunnel junction layer, using the etching gas.
地址 Gyeonggi-do KR