发明名称 光導波路型測定システム、測定方法及び光導波路型センサチップ
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an optical waveguide type measurement system in which detection sensitivity of a measurement object material is more improved to higher accuracy, and a measurement method and an optical waveguide type sensor chip thereof. <P>SOLUTION: The optical waveguide type measurement system includes an optical waveguide having a sensing area where first substances that specifically bind to the measurement object material are immobilized; magnetic fine particles in which second substances that specifically bind to the measurement object material are immobilized, and which have magnetism; a magnetic field applying unit for generating a magnetic field that moves the magnetic particles; a light source that makes light incident to the optical waveguide; and a light receiving element for receiving light emitted from the optical waveguide. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5814806(B2) 申请公布日期 2015.11.17
申请号 JP20120011456 申请日期 2012.01.23
申请人 发明人
分类号 G01N33/543;G01N21/27;G01N33/553 主分类号 G01N33/543
代理机构 代理人
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