| 摘要 |
PROBLEM TO BE SOLVED: To provide a technique advantageous for enhancing the focus detection accuracy of a solid state image sensor including an imaging pixel and a focus detection pixel.SOLUTION: In a solid state image sensor including a plurality of pixels arranged on a semiconductor substrate, each pixel has a photoelectric conversion part formed on the semiconductor substrate, and an amplification transistor outputting a signal depending on the charges generated in the photoelectric conversion part, the plurality of pixels include an imaging pixel and a focus detection pixel, and in the plan view for the upper surface of the semiconductor substrate, the area of the photoelectric conversion part of the focus detection pixel is smaller than the area of the photoelectric conversion part of the imaging pixel, and the area of the gate of the amplification transistor of the focus detection pixel is larger than the area of the gate of the amplification transistor of the imaging pixel. |
