发明名称 SELF-DIAGNOSIS CIRCUIT, DEVICE, SELF-DIAGNOSIS METHOD, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a self-diagnosis circuit capable of improving the flexibility of an inspection.SOLUTION: An FPGA (Filed Programmable Gate Array) 3 is installed in a device 100, and configured to construct a CPU on the basis of configuration data, and to allow the CPU to execute an inspection program for inspecting the device 100 so that it is possible to execute an inspection of the device 100. Thus, it is not necessary to input any signal for inspecting the device 100 to an input port 1 of the device 100, and to output a signal indicating an inspection result from an output port 2 of the device 100. Therefore, it is possible to execute an inspection by the self-diagnosis of the device 100, and it is not necessary to provide any inspection device such as an inspection jig or a measurement device to be connected to the input port 1 or the output port 2 of the device 100. Also, it is possible to execute an inspection by the CPU constructed on the basis of the configuration data by the FPGA 3, and to change the configuration of the CPU which executes an inspection or the inspection program to be executed by the CPU. Thus, it is possible to improve the flexibility of an inspection.
申请公布号 JP2015203953(A) 申请公布日期 2015.11.16
申请号 JP20140082688 申请日期 2014.04.14
申请人 NEC PLATFORMS LTD 发明人 TSUTSUI YASUMITSU
分类号 G06F11/22 主分类号 G06F11/22
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