发明名称 HIGH CAPACITY TEM GRID
摘要 PROBLEM TO BE SOLVED: To provide a TEM grid used in a transmission electron microscopy method, to which a plurality of samples can be simultaneously attached, and a method for attaching samples to the TEM grid.SOLUTION: A TEM grid 402 provides posts 414 having steps 418 that are formed in a body 404, the steps 418 increasing the number of samples that can be attached to the grid 402. Each post 414 includes a one sided step 418 configuration. A method of extracting multiple samples from a substrate and fixing the samples to the grid 402 includes the repetition of extracting samples from the substrate and attaching the samples to the different steps 418 on the posts 414.
申请公布号 JP2015204296(A) 申请公布日期 2015.11.16
申请号 JP20150080464 申请日期 2015.04.09
申请人 FEI CO 发明人 BRIAN ROBERTS ROUTH JR;VALERIE BROGDEN;SCHMIDT MICHAEL
分类号 H01J37/20;G01N1/28;H01J37/305;H01J37/317 主分类号 H01J37/20
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