发明名称 ARRAY SUBSTRATE AND TESTING METHOD AND MANUFACTURING METHOD THEREOF
摘要 An array substrate, a testing method and a manufacturing method of the array substrate are disclosed. The array substrate comprises a first test line (3), a second test line (4), and first data lines (1) and second data lines (2) that are disposed alternately. The first data lines (1) are directly connected to the first test line (3), and the second data lines (2) are connected to the second test line (4) through switch elements (7); or, the second data lines (2) are directly connected to the second test line (4), and the first data lines (1) are connected to the first test line (3) through switch elements (7). With the array substrate, charges in the display region can be avoided from being transferred to a test line, thereby decreasing the accumulation of static electricity, and enhancing reliability of the short bar region.
申请公布号 US2015325159(A1) 申请公布日期 2015.11.12
申请号 US201314404180 申请日期 2013.12.12
申请人 BOE Technology Group Co., Ltd. ;Beijing BOE Display Technology Co., Ltd. 发明人 LI Liangliang;GUO Zongjie;DING Xiangqian;LIU Yao;BAI Jinchao
分类号 G09G3/00;G01R31/28;G02F1/13;H01L27/12 主分类号 G09G3/00
代理机构 代理人
主权项 1. An array substrate, comprising a first test line, a second test line, and first data lines and second data lines that are disposed alternately; wherein the first data lines are directly connected to the first test line, and the second data lines are connected to the second test line through switch elements; or, the second data lines are directly connected to the second test line, and the first data lines are connected to the first test line through switch elements.
地址 Beijing CN