| 发明名称 |
SELF-ALIGNING PROBES AND RELATED DEVICES |
| 摘要 |
The field of the invention generally relates to probes, related devices and methods for measuring material properties. In an embodiment, the present invention provides a test probe for use in a reference point indentation device. The test probe has an end proximal to a tip and an end distal to the tip. The distal end of the test probe has a self-centering mate comprising a countersink of about 90 degrees to about 100 degrees to a depth of between 0.010 in. and 0.035 in. |
| 申请公布号 |
US2015323436(A1) |
申请公布日期 |
2015.11.12 |
| 申请号 |
US201314392010 |
申请日期 |
2013.07.22 |
| 申请人 |
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
发明人 |
Hansma Paul K.;Randall Connor;Bridges Daniel |
| 分类号 |
G01N3/40;G01N3/04 |
主分类号 |
G01N3/40 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test probe for use in a reference point indentation device, wherein the test probe has an end proximal to a tip and an end distal to the tip, and wherein the distal end of the test probe has a self-centering mate comprising a countersink of about 90 degrees to about 100 degrees to a depth of between 0.010 in. and 0.035 in. |
| 地址 |
Oakland CA US |
