发明名称 DISTORTION MEASURING DEVICE, DISTORTION AMOUNT, AND DISTORTION DIRECTION MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a distortion measuring device capable of measuring a direction and magnitude of distortion which accompanies deformation of a complicated and a wide range of shapes.SOLUTION: A distortion measuring device includes a plurality of capacitance type sensors having a dielectric layer composed of an elastomer composition and an electrode layer laminated on a front side and a rear side of the dielectric layer. The plurality of capacitance type sensors comprises a band-like flat shape. At least one end part of one capacitance type sensor is connected with at least one end part of another capacitance type sensor in a direction not matching with a mutual longitudinal direction, and a distortion amount and a distortion direction are measured from an amount of contraction in the longitudinal direction of the plurality of capacitance type sensors. The plurality of capacitance type sensors may be connected so as to constitute each side of a triangle in a planar view. The plurality of capacitance type sensors may be regularly arranged. The plurality of capacitance type sensors may be arranged at random. The electrode layer may include a carbon nanotube.
申请公布号 JP2015200501(A) 申请公布日期 2015.11.12
申请号 JP20140077391 申请日期 2014.04.03
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY;BANDO CHEM IND LTD;KOBE UNIV 发明人 TADA MITSUNORI;OTAKA HIDEO;NAKAMOTO HIROYUKI
分类号 G01B7/16 主分类号 G01B7/16
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