发明名称 ERROR CORRECTION IN MULTIPLE SEMICONDUCTOR MEMORY UNITS
摘要 PROBLEM TO BE SOLVED: To provide a function for detecting an error in each of a plurality of semiconductor memory units and correcting corrupted data.SOLUTION: A function stores data 240, 241, 242, and 243 in first semiconductor memory units 210, 211, 212, and 213 and stores error correction information 244 in a second semiconductor memory unit 214 to recover the data. The error correction information has a value equal to at least a value of the data stored in the first memory units.
申请公布号 JP2015201221(A) 申请公布日期 2015.11.12
申请号 JP20150115409 申请日期 2015.06.08
申请人 MICRON TECHNOLOGY INC 发明人 DAVID R RESNICK
分类号 G06F12/16;G11C29/42 主分类号 G06F12/16
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