ON-CHIP CURRENT TEST CIRCUIT

摘要

An integrated circuit that includes a processor also has an on-chip current test circuit that indirectly measures quiescent current in the processor. A supply voltage pin of the integrated circuit receives a supply voltage from an external test unit to provide power to the processor. The on-chip test circuit measures a voltage change across the processor during a predetermined test period T when the processor is isolated from the supply voltage and the clock signal is stopped. The voltage change provides an indication of quiescent current corresponding to the processor.

主权项

1. An integrated circuit, comprising:
a supply voltage input pin configured for connection to an external test unit to receive a supply voltage; processing circuitry configured to perform processing operations controlled by a clock signal and powered by the supply voltage; and an on-chip test circuit for testing operation of the processing circuitry, wherein the on-chip test circuit measures a voltage change across the processing circuitry during a predetermined test period T when the processing circuitry is isolated from the supply voltage and the clock signal is stopped, wherein the voltage change provides an indication of quiescent current corresponding to the processing circuitry.