发明名称 DEFECTIVE PLACE PREDICTION APPARATUS, DEFECTIVE PLACE PREDICTION PROGRAM AND DEFECTIVE PLACE PREDICTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a defective place prediction apparatus, a defective place prediction program and a defective place prediction method capable of efficiently correct a defective place.SOLUTION: A reliability calculation section 43 calculates confidence level of an identification model for identifying a defective place from a layout pattern. A correction priority calculation section 44 calculates the priority of correction by using the confidence level calculated by the reliability calculation section 43 with respect to the defective place identified from the layout pattern as the inspection object based on the identification model.
申请公布号 JP2015201055(A) 申请公布日期 2015.11.12
申请号 JP20140079759 申请日期 2014.04.08
申请人 FUJITSU LTD 发明人 NITTA IZUMI
分类号 G06F17/50;G03F1/70 主分类号 G06F17/50
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