发明名称 |
AUTOMATIC CALIBRATION SAMPLE SELECTION FOR DIE-TO-DATABASE PHOTOMASK INSPECTION |
摘要 |
A method for selecting samples of reticle design data patterns in order to calibrate the parameters based on which the reference image used in a die-to-database reticle inspection method is rendered, the method comprising the steps of applying local binary pattern (LBP) analysis to a plurality of samples to obtain a p-dimensional vector output for each of the plurality of samples, clustering the q-D data points to M groups, selecting one sample from each clustered group, calculating evaluation scores for the samples selected, and, selecting a portion of the M samples on the representativeness score and the diversity score. |
申请公布号 |
US2015324664(A1) |
申请公布日期 |
2015.11.12 |
申请号 |
US201514703546 |
申请日期 |
2015.05.04 |
申请人 |
KLA-Tencor Corporation |
发明人 |
Zhao Feng;Pan Gang |
分类号 |
G06K9/62;G06K9/52;G06T1/20;G06T7/00 |
主分类号 |
G06K9/62 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for selecting samples of reticle design data patterns in order to calibrate the parameters based on which the reference image used in a die-to-database reticle inspection method is rendered, the method comprising the steps of:
applying local binary pattern (LBP) analysis to a plurality of design data samples to obtain a p-dimensional vector output for each of the plurality of samples; clustering the set of vector output data points into M number of groups; selecting one sample from each clustered group; calculating evaluation scores for the samples selected; and, selecting a portion of the M samples on the representativeness score and the diversity score. |
地址 |
Milpitas CA US |