| 发明名称 |
NONCONTACT RAPID DEFECT DETECTION OF BARRIER FILMS |
| 摘要 |
A method of detecting a defect in a barrier film. The method includes: coating the barrier film with a solution having a plurality of probes, where each of the probes has a nanoparticle; forcing a probe of the plurality of probes to penetrate the defect by applying a field to the barrier film, where the field induces an attractive power to the nanoparticles of the probes; applying an optical excitation (OE) to the barrier film; and identifying the defect in the barrier film based on an optical signal emitted, in response to the OE, by the probe forced to penetrate the defect. |
| 申请公布号 |
US2015323458(A1) |
申请公布日期 |
2015.11.12 |
| 申请号 |
US201314421742 |
申请日期 |
2013.09.26 |
| 申请人 |
Konica Minolta Laboratory U.S.A. Inc. |
发明人 |
Amano Jun |
| 分类号 |
G01N21/64;G01N21/84;G01N21/88 |
主分类号 |
G01N21/64 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of detecting a defect in a barrier film, comprising:
coating the barrier film with a solution comprising a plurality of probes, wherein each of the probes comprises a nanoparticle; forcing a probe of the plurality of probes to penetrate the defect by applying a field to the barrier film, wherein the field induces an attractive power to the nanoparticles of the probes; applying an optical excitation (OE) to the barrier film; and identifying the defect in the barrier film based on an optical signal emitted, in response to the OE, by the probe forced to penetrate the defect. |
| 地址 |
San Mateo CA US |
