发明名称 |
Low Power Testing Based On Dynamic Grouping Of Scan |
摘要 |
Aspects of the disclosed technology relate to low power testing. A low power test circuit comprises a test stimulus source, a controller; and a grouping and selection unit. The grouping and selection unit has inputs coupled to the test stimulus source and the controller and has outputs coupled to a plurality of scan chains. The grouping and selection unit is configured to dynamically group scan chains in the plurality of scan chains into a plurality of scan chain groups and to selectively output either original test pattern values generated by the test stimulus source or a constant value to each scan chain group in the plurality of scan chain groups based on control signals received from the controller. |
申请公布号 |
US2015323597(A1) |
申请公布日期 |
2015.11.12 |
申请号 |
US201514710390 |
申请日期 |
2015.05.12 |
申请人 |
Mentor Graphics Corporation |
发明人 |
Rajski Janusz;Milewski Sylwester;Mrugalski Grzegorz;Tyszer Jerzy |
分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
|
主权项 |
1. An integrated circuit, comprising:
a test stimulus source; a controller; and a grouping and selection unit having inputs coupled to the test stimulus source and the controller and having outputs coupled to a plurality of scan chains, wherein the grouping and selection unit is configured to dynamically group scan chains in the plurality of scan chains into a plurality of scan chain groups and to selectively output either original test pattern values generated by the test stimulus source or a constant value to each scan chain group in the plurality of scan chain groups based on control signals received from the controller. |
地址 |
Wilsonville OR US |