METHOD FOR CONTINUOUSLY INSPECTING ELECTRIC PROPERTIES OF ELECTRONIC CHIP COMPONENT

摘要

Provided is a method to suppress lowering of precise inspection without extending an inspection process wherein the precise inspection is found when the electric features of an electronic chip component are continuously inspected. In a method to continuously inspect electric features of an electronic chip component using an electronic chip component transfer disc wherein at least three rows of penetration holes are concentrically formed on a surface of the electronic chip component transfer disc; introduced is a method to eliminate an oxide film generated in a leading end of a corresponding electrode terminal by applying a direct current to the electrode terminal contacting another one electronic chip component or at least one electronic chip component when electric features of one electronic chip component among the electronic chip components are inspected wherein the electronic chip components are accommodated in penetration holes respectively which are adjacent to a radius direction of the disc.