发明名称 Semiconductor device and method of fabricating the same
摘要 A semiconductor device includes an isolation layer defining an active region formed in a semiconductor substrate. A first recessing process is performed on the isolation layer to expose edge portions of the active region. A first rounding process is performed to round the edge portions of the active region. A second recessing process is performed on the isolation layer. A second rounding process is performed to round the edge portions of the active region.
申请公布号 US9184232(B2) 申请公布日期 2015.11.10
申请号 US201414538046 申请日期 2014.11.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Kim Jung-Hwan;Leam Hun-Hyeoung;Kim Tae-Hyun;Nam Seok-Woo;Namkoong Hyun;Kim Yong-Seok;Yu Tea-Kwang
分类号 H01L29/06;H01L21/28;H01L21/762;H01L21/8234;H01L27/115;H01L29/423;H01L29/66;H01L29/78 主分类号 H01L29/06
代理机构 F. Chau & Associates, LLC 代理人 F. Chau & Associates, LLC
主权项 1. A semiconductor device comprising: a semiconductor substrate; a semiconductor active region disposed on a surface of the semiconductor substrate, wherein the semiconductor active region protrudes away from the surface of the semiconductor substrate, wherein the semiconductor active region includes first and second sidewalls and a round top surface disposed between the first and second sidewalls and wherein the round top surface has no flat portion; and an isolation layer disposed on the surface of the semiconductor substrate to define the semiconductor active region, wherein the semiconductor active region protrudes beyond a surface of the isolation layer.
地址 Suwon-Si, Gyeonggi-Do KR