发明名称 |
Semiconductor device and method of fabricating the same |
摘要 |
A semiconductor device includes an isolation layer defining an active region formed in a semiconductor substrate. A first recessing process is performed on the isolation layer to expose edge portions of the active region. A first rounding process is performed to round the edge portions of the active region. A second recessing process is performed on the isolation layer. A second rounding process is performed to round the edge portions of the active region. |
申请公布号 |
US9184232(B2) |
申请公布日期 |
2015.11.10 |
申请号 |
US201414538046 |
申请日期 |
2014.11.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Kim Jung-Hwan;Leam Hun-Hyeoung;Kim Tae-Hyun;Nam Seok-Woo;Namkoong Hyun;Kim Yong-Seok;Yu Tea-Kwang |
分类号 |
H01L29/06;H01L21/28;H01L21/762;H01L21/8234;H01L27/115;H01L29/423;H01L29/66;H01L29/78 |
主分类号 |
H01L29/06 |
代理机构 |
F. Chau & Associates, LLC |
代理人 |
F. Chau & Associates, LLC |
主权项 |
1. A semiconductor device comprising:
a semiconductor substrate; a semiconductor active region disposed on a surface of the semiconductor substrate, wherein the semiconductor active region protrudes away from the surface of the semiconductor substrate, wherein the semiconductor active region includes first and second sidewalls and a round top surface disposed between the first and second sidewalls and wherein the round top surface has no flat portion; and an isolation layer disposed on the surface of the semiconductor substrate to define the semiconductor active region, wherein the semiconductor active region protrudes beyond a surface of the isolation layer. |
地址 |
Suwon-Si, Gyeonggi-Do KR |