发明名称 Semiconductor devices and methods of fabricating semiconductor devices
摘要 Semiconductor devices are provided. A semiconductor device may include a substrate and a plurality of lines on the substrate. The semiconductor device may include a dielectric layer on the substrate and adjacent the plurality of lines. The semiconductor device may include a connection element in the dielectric layer. In some embodiments, the semiconductor device may include a plurality of contacts on the connection element, and a conductive interconnection on one of the plurality of contacts that are on the connection element and on a contact that is spaced apart from the connection element.
申请公布号 US9184174(B2) 申请公布日期 2015.11.10
申请号 US201414155649 申请日期 2014.01.15
申请人 Samsung Electronics Co., Ltd. 发明人 Yun Jang-Gn;Kim Hongsoo;Park Aaron;Cho Hoosung
分类号 H01L23/48;H01L23/52;H01L29/40;H01L27/115 主分类号 H01L23/48
代理机构 Myers Bigel Sibley & Sajovec, PA 代理人 Myers Bigel Sibley & Sajovec, PA
主权项 1. A semiconductor device comprising: a substrate; spaced-apart first and second conductive lines extending in a first direction on the substrate; an interlayer dielectric on the first and second conductive lines; first and second contact plugs in the interlayer dielectric and contacting the first and second conductive lines, respectively; and a connection structure configured to electrically connect the first and second conductive lines, the connection structure comprising a connection element extending in a second direction that intersects the first direction, wherein the connection element is disposed in the interlayer dielectric, wherein the connection element is vertically non-overlapping with the first and second conductive lines and is spaced apart from the first and second contact plugs, and wherein a top surface of the connection element is substantially coplanar with respective top surfaces of the first and second contact plugs.
地址 KR