| 发明名称 |
Analysis apparatus for high energy particle and analysis method using the same |
| 摘要 |
Provided is an analysis apparatus for a high energy particle and an analysis method for a high energy particle. The analysis apparatus for the high energy particle includes a scintillator generating photons with each unique wavelength by the impinging with a plurality of kinds of accelerated high energy particles, a parallel beam converting unit making the photons proceed in parallel to one another, a diffraction grating panel making the photons proceeding in parallel to one another enter at a certain angle, and refracting the photons at different angles depending on each unique wavelength, and a plurality of sensing units arranged on positions where the photons refracted at different angles from the diffraction grating panel reach in a state of being spatially separated, and detecting each of the photons. |
| 申请公布号 |
US9182502(B2) |
申请公布日期 |
2015.11.10 |
| 申请号 |
US201313873708 |
申请日期 |
2013.04.30 |
| 申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
Jung Moon Youn;Myung Nam Soo;Shin Dong-Ho;Lee Hwang Woon;Song Dong Hoon;Kim Seunghwan |
| 分类号 |
G01T1/20;G01N15/14;G01N23/20;B82Y15/00 |
主分类号 |
G01T1/20 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An analysis apparatus comprising:
a scintillator generating photons with unique wavelengths by the impinging with a plurality of kinds of accelerated particles; a parallel beam converting unit making the photons proceed in parallel to one another; a diffraction grating panel making the photons proceeding in parallel to one another enter at a certain angle, and refracting the photons at different angles depending on each unique wavelength; and a plurality of sensing units spatially separated and arranged at positions where the photons refracted at different angles from the diffraction grating panel reach, and detecting each of the photons. |
| 地址 |
Daejeon KR |
