| 摘要 |
The present invention relates to a test socket which includes a color changeable material and represents an opaque color at a normal temperature and in which the color is changed to the other color according to test conditions such as light and temperature. Accordingly, when testing a BGA-type semiconductor element and also the other kinds of semiconductor elements, a test socket keeps an opaque state at a normal temperature. Therefore, when photographing a test socket by a photographing device, it is possible to accurately confirm a replacement state of the semiconductor element, and also it is possible to accurately determine whether there is a defect such as short and bridge of the semiconductor element. In addition, since the test socket keeps the opaque state at the normal temperature, it is possible to keep security for the semiconductor element, and it is possible to simply and easily perform a test of the semiconductor element by changing a kind and a color of a color-changed material included in the test socket according to test conditions such as light and temperature. Moreover, when the test socket is configured such that a color is changed according to the change in temperature, it is possible to obtain information about a heating state of the semiconductor element according to the change in temperature without separate additional equipment, it is possible to easily and accurately perform a temperature test of the semiconductor element, and it is possible to improve reliability of the temperature test. |
