发明名称 3Dメモリに適用するPECVD酸化物−窒化物スタック及び酸化物−シリコンスタック
摘要 <p>A layer stack of different materials is deposited on a substrate in a single plasma enhanced chemical vapor deposition processing chamber while maintaining a vacuum. A substrate is placed in the processing chamber and a first processing gas is used to form a first layer of a first material on the substrate. A plasma purge and gas purge are performed before a second processing gas is used to form a second layer of a second material on the substrate. The plasma purge and gas purge are repeated and the additional layers of first and second materials are deposited on the layer stack.</p>
申请公布号 JP5808814(B2) 申请公布日期 2015.11.10
申请号 JP20130532837 申请日期 2011.09.28
申请人 发明人
分类号 H01L21/31;C23C16/42;H01L21/205;H01L21/316;H01L21/318;H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;H05H1/46 主分类号 H01L21/31
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