发明名称 System and methods for memory installation in functional test fixture
摘要 A system and a method for testing information handling systems is provided. The system includes a top cover having a memory circuit and a bottom platform for receiving a test printed circuit board assembly (PCBA) including a slot. The system includes a sensor determining the relative position of the memory circuit and the slot; and a host controller coupled to the test PCBA and the sensor through a port. A computer program product including a non-transitory computer readable medium having computer readable and executable code is also provided. The code instructs a processor in a host controller in a test fixture to load a memory circuit on a crane; engage a sub-module carrying the memory circuit; load a printed circuit board assembly (PCBA); place a memory device on a slot in the PCBA; perform a system test on the PCBA; disengage the sub-module and the test fixture.
申请公布号 US9182444(B2) 申请公布日期 2015.11.10
申请号 US201213710376 申请日期 2012.12.10
申请人 Dell Products, L.P. 发明人 Jia Hui Peng;Yang Chungfeng;Li Bin
分类号 G01R31/28;G11C29/56;G01R1/04 主分类号 G01R31/28
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A system for testing a plurality of information handling systems, the system comprising: a top cover; a bottom platform for receiving a test printed circuit board assembly (PCBA), the test PCBA comprising a slot having a slot locker; a crane mounted to the top cover, wherein the crane comprises a cartridge to hold a memory circuit, movable arms, and one or more levers to provide a swinging motion to the movable arms in order to lock and unlock the slot locker; a sensor to determine the relative position of the memory circuit and the slot in the test PCBA; anda host controller coupled to the test PCBA and the sensor through a host controller port.
地址 Round Rock TX US