发明名称 |
REMOVAL METHOD OF WORK-AFFECTED LAYER OF SiC SEED CRYSTAL, SiC SEED CRYSTAL, AND PRODUCTION METHOD OF SiC SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method capable of preventing decline of a growth rate, even when performing MSE method by using a cut SiC seed crystal.SOLUTION: A SiC seed crystal used as a seed crystal for a metastable solvent epitaxy method (MSE method) is heated under a Si atmosphere and the surface is etched, to thereby remove a work-affected layer generated by cutting. Since the work-affected layer generated in the SiC seed crystal blocks growth in the MSE method, decline of a growth rate can be prevented by removing the work-affected layer. |
申请公布号 |
JP2015196616(A) |
申请公布日期 |
2015.11.09 |
申请号 |
JP20140074742 |
申请日期 |
2014.03.31 |
申请人 |
TOYO TANSO KK |
发明人 |
YABUKI NORITO;TORIMI SATOSHI;NOGAMI AKIRA |
分类号 |
C30B33/12;C30B19/04;C30B29/36 |
主分类号 |
C30B33/12 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|