发明名称 REMOVAL METHOD OF WORK-AFFECTED LAYER OF SiC SEED CRYSTAL, SiC SEED CRYSTAL, AND PRODUCTION METHOD OF SiC SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method capable of preventing decline of a growth rate, even when performing MSE method by using a cut SiC seed crystal.SOLUTION: A SiC seed crystal used as a seed crystal for a metastable solvent epitaxy method (MSE method) is heated under a Si atmosphere and the surface is etched, to thereby remove a work-affected layer generated by cutting. Since the work-affected layer generated in the SiC seed crystal blocks growth in the MSE method, decline of a growth rate can be prevented by removing the work-affected layer.
申请公布号 JP2015196616(A) 申请公布日期 2015.11.09
申请号 JP20140074742 申请日期 2014.03.31
申请人 TOYO TANSO KK 发明人 YABUKI NORITO;TORIMI SATOSHI;NOGAMI AKIRA
分类号 C30B33/12;C30B19/04;C30B29/36 主分类号 C30B33/12
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