| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device and a test system for the semiconductor device with which it is possible to reduce the test time by a test device.SOLUTION: An IC chip 1 includes a transmission/reception unit 3 and an internal circuit 4. The transmission/reception unit 3 is capable of transmitting and receiving, by wireless, a test signal or test result on two different frequencies f1, f2 at the same time. The internal circuit 4 has a test circuit 5 and a circuit 6 to be tested. A test device 2 has a test signal processing unit 7 and a transmission/reception unit 8. The transmission/reception unit 8 is capable of transmission and reception by the IC chip 1 and wireless on the two different frequencies f1, f2 at the same time. The test device 2 divides the test content of the IC chip 1 into two and transmits the divided contents on the different frequencies f1 and f2 at the same time. It is thereby possible to reduce the transmission time of the test signal. |
