| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection chip for reducing a possibility that inspection accuracy declines.SOLUTION: An inspection chip 2 includes a bead holding part 410, a reagent introduction part 560, and a take-out part 570 on a first surface 203 and a magnet holding part 450 on a second surface 204. The bead holding part 410 holds magnetic beads 31. The reagent introduction part 560 introduces a reagent 9 to be mixed with the magnetic beads 31 held in the bead holding part 410 into the bead holding part 410. The take-out part 570 lets the reagent 9 that contacted with the bead holding part flow out. The magnet holding part 450, facing the bead holding part 410, movably holds a magnet 451. The bead holding part 410 and the magnet holding part 450 are separated by a partition 20. |
