METHOD OF TESTING SEMICONDUCTOR MEMORY DEVICE, TEST DEVICE, AND COMPUTER READABLE RECORDING MEDIUM FOR RECORDING TEST PROGRAM FOR SEMICONDUCTOR MEMORY DEVICE

摘要

PROBLEM TO BE SOLVED: To provide a method of testing a semiconductor memory device, a test device, and a computer readable recording medium for recording a test program for the semiconductor memory device.SOLUTION: A testing method includes: performing a test according to each of a plurality of cases corresponding to a first generation and generating modeled test results for each of the plurality of cases S200; determining optimum cases from among the plurality of cases on the basis of the modeled test results S210; and generating a plurality of cases corresponding to a second generation on the basis of the optimum cases S220.