发明名称 Magnetoresistive Structure having Two Dielectric Layers, and Method of Manufacturing Same
摘要 A magnetoresistive structure having two dielectric layers, and method of manufacturing same, includes a free magnetic layer positioned between the two dielectric layers. The method of manufacture comprises at least two etch processes and at least an encapsulation process interposed therebetween wherein the encapsulation is formed on sidewalls of the partially formed magnetoresistive stack between etch processes.
申请公布号 US2015318465(A1) 申请公布日期 2015.11.05
申请号 US201514797172 申请日期 2015.07.12
申请人 Everspin Technologies, Inc. 发明人 Aggarwal Sanjeev;Nagel Kerry;Janesky Jason
分类号 H01L43/02;H01L43/12;H01L43/08 主分类号 H01L43/02
代理机构 代理人
主权项 1. A method of manufacturing a magnetoresistive device from: (i) a first electrode, (ii) a first dielectric layer disposed over the first electrode, (iii) a free layer disposed over the first tunnel barrier, (iv) a second tunnel barrier layer disposed over the free layer, (v) a second electrode disposed over the second dielectric layer, method of manufacturing comprising: etching through the second electrode and the second dielectric layer to provide a sidewall of (i) the second electrode and (ii) the second dielectric layer; forming an encapsulation material on the sidewall of the second electrode and the second dielectric layer; and after forming the encapsulation material on the sidewall of the second electrode and the second dielectric layer, etching through the surface of the free magnetic layer and at least a portion of the first dielectric layer.
地址 Chandler AZ US