发明名称 SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD OF STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide a surface inspection device and a surface inspection method of a structure capable of performing surface inspection of a structure at a higher speed and improving inspection efficiency.SOLUTION: The surface inspection device of a structure includes a pressure change generation device 5 for moving a stress luminescent structure part 2 for emitting light in accordance with stress in a direction along the surface of a structure 1 of an inspection object provided on a surface to generate a compression change on the surface of the structure 1, an imaging device 6 which moves integrally with the pressure change generation device 5 to image an area in which pressure change of the surface of the structure 1 occurs, and an image processor 7 for detecting a defect of the surface of the structure 1 on the basis of an image of the structure 1 obtained by the imaging device 6.
申请公布号 JP2015194418(A) 申请公布日期 2015.11.05
申请号 JP20140072761 申请日期 2014.03.31
申请人 HITACHI LTD 发明人 KONISHI TAKAAKI;MATSUI TETSUYA;NAGASHIMA YOSHIAKI;NAKANO HIROYUKI;MIZOTA HIROHISA
分类号 G01N21/954;G01M99/00;G01N21/88 主分类号 G01N21/954
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