发明名称 |
SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD OF STRUCTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide a surface inspection device and a surface inspection method of a structure capable of performing surface inspection of a structure at a higher speed and improving inspection efficiency.SOLUTION: The surface inspection device of a structure includes a pressure change generation device 5 for moving a stress luminescent structure part 2 for emitting light in accordance with stress in a direction along the surface of a structure 1 of an inspection object provided on a surface to generate a compression change on the surface of the structure 1, an imaging device 6 which moves integrally with the pressure change generation device 5 to image an area in which pressure change of the surface of the structure 1 occurs, and an image processor 7 for detecting a defect of the surface of the structure 1 on the basis of an image of the structure 1 obtained by the imaging device 6. |
申请公布号 |
JP2015194418(A) |
申请公布日期 |
2015.11.05 |
申请号 |
JP20140072761 |
申请日期 |
2014.03.31 |
申请人 |
HITACHI LTD |
发明人 |
KONISHI TAKAAKI;MATSUI TETSUYA;NAGASHIMA YOSHIAKI;NAKANO HIROYUKI;MIZOTA HIROHISA |
分类号 |
G01N21/954;G01M99/00;G01N21/88 |
主分类号 |
G01N21/954 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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