发明名称 METHOD OF FORMING PHOTORESIST PATTERN AND METHOD OF MANUFACTURING INTEGRATED CIRCUIT DEVICE INCLUDING PHOTORESIST PATTERN
摘要 Provided are a method for forming a photoresist pattern obtained by decompressing a photoresist film, and a method for manufacturing an integrated circuit device. The method for forming a photoresist pattern discharges bubbles from a photoresist film by decompressing the photoresist film. The method for manufacturing an integrated circuit device forms a photoresist film on a substrate including at least one electronic component; and discharges bubbles from the photoresist film by decompressing the photoresist film. A photoresist pattern for covering the electronic component is formed by exposing and developing the photoresist film.
申请公布号 KR20150124266(A) 申请公布日期 2015.11.05
申请号 KR20140050928 申请日期 2014.04.28
申请人 KWANGWOON UNIVERSITY INDUSTRY-ACADEMIC COLLABORATION FOUNDATION 发明人 WANG CONG;KIM, NAM YOUNG
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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