发明名称 SETTING ABNORMALITY DETERMINATION DEVICE AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To solve the problem that an imaging apparatus may be disabled from capturing an image including a face available for collation or the like by an imaging environment change or the like.SOLUTION: A setting abnormality determination device includes: a face detection count acquisition section for acquiring a face detection count indicating the number of faces detected from a plurality of images captured by an imaging apparatus; a face size acquisition section for acquiring a face size of a face detected from at least one of the plurality of images in the case where the face detection count is not settled within a reference face detection count range indicating a predetermined range of the face detection count; and a setting abnormality determination section for determining that settings of the imaging apparatus are abnormal in the case where the face size is not settled within a reference face size range indicating a predetermined range of face sizes.
申请公布号 JP2015195459(A) 申请公布日期 2015.11.05
申请号 JP20140071654 申请日期 2014.03.31
申请人 OMRON CORP 发明人 YAMASHITA EISUKE;KAWAMOTO SHINGO
分类号 H04N5/232 主分类号 H04N5/232
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