发明名称 CHEMICAL TREATMENT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a chemical treatment device which can highly accurately maintain the quality of an object to be treated after the object to be treated has been treated.SOLUTION: In an etching device 100 immersing a wafer cassette into an etchant in an etching bath to be treated, an etching time during which the wafer cassette is immersed into the etching bath is determined according to the degree of degradation of the etchant due to a precedent wafer cassette whose etching treatment is completed before the wafer cassette is subjected to etching treatment.
申请公布号 JP2015195260(A) 申请公布日期 2015.11.05
申请号 JP20140072009 申请日期 2014.03.31
申请人 SUMITOMO METAL MINING CO LTD 发明人 KOGA TAKAHIRO
分类号 H01L21/306;H01L21/304 主分类号 H01L21/306
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