发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
The present invention is provided with: a semiconductor element (5), which has a semiconductor substrate (1), an insulating film (2) that is formed on a surface (1A) of the semiconductor substrate (1) and that has an opening, and an electrode (3) that is formed within the opening on the surface (1A) of the semiconductor substrate (1); and a first protective film (9) that is provided so as to cover the semiconductor element (5). The film thickness (W1) of the insulating film (2) is 1/500-4 μm of the semiconductor substrate thickness (W2), and the compressive stress of the insulating film per film thickness is 100 MPa/μm or greater. |
申请公布号 |
WO2015166737(A1) |
申请公布日期 |
2015.11.05 |
申请号 |
WO2015JP57853 |
申请日期 |
2015.03.17 |
申请人 |
MITSUBISHI ELECTRIC CORPORATION |
发明人 |
NEGISHI, TETSU;TERAI, MAMORU;YAMAMOTO, KEI |
分类号 |
H01L21/316;H01L21/336;H01L21/768;H01L23/532;H01L25/07;H01L25/18;H01L29/78 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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