发明名称 METHOD AND APPARATUS FOR OPTIMIZING DEPTH INFORMATION
摘要 Method and apparatus for optimizing depth information are provided. One of a left image and a right image is divided into a plurality of segmentations for obtaining a plurality of segmentation maps. A necessary repair depth map is obtained, and the necessary repair depth map is partitioned into a plurality of depth planes according to a plurality of primary depth values and a camera parameter. The primary depth values are recorded in the necessary repair depth map having a plurality of holes. A plurality of optimized depth values are respectively generated for the holes in each of the depth planes by using the segmentation maps, and the optimized depth values are filled into the depth planes to obtain an optimized depth map.
申请公布号 US2015319421(A1) 申请公布日期 2015.11.05
申请号 US201414304983 申请日期 2014.06.16
申请人 Altek Semiconductor Corp. 发明人 Chung Yu-Chia;Chang Wen-Yan;Tseng Chia-Chun;Lee Yun-Chin
分类号 H04N13/02;G06T7/00 主分类号 H04N13/02
代理机构 代理人
主权项 1. A method for optimizing depth information, for an electronic device, wherein a left image and a right image are generated through shooting of a three dimensional imaging system, and the method comprises: dividing one of the left image and the right image into a plurality of segmentations to obtain a plurality of segmentation maps; obtaining a necessary repair depth map, and partitioning the necessary repair depth map into a plurality of depth planes according to a plurality of primary depth values and a camera parameter, wherein the necessary repair depth map records the primary depth values and has a plurality of holes; and respectively generating a plurality of optimized depth values for the holes in each of the depth planes by using the segmentation maps, and filling the optimized depth values into the depth planes to obtain an optimized depth map combining each of the depth planes.
地址 Hsinchu City TW