发明名称 METHOD, SYSTEM AND DEVICE FOR RECESSED CONTACT IN MEMORY ARRAY
摘要 Embodiments disclosed herein may relate to forming a contact region for an interconnect between a selector transistor and a word-line electrode in a memory device.
申请公布号 US2015318331(A1) 申请公布日期 2015.11.05
申请号 US201514799471 申请日期 2015.07.14
申请人 MICRON TECHNOLOGY, INC. 发明人 Pellizzer Fabio;Rigano Antonino;Mariani Marcello;Benvenuti Augusto
分类号 H01L27/24;H01L29/423;H01L45/00 主分类号 H01L27/24
代理机构 代理人
主权项 1. A method, comprising: forming one or more recessed word-line contact regions in a first material of a phase change memory array, including performing a pitch multiplication operation.
地址 Boise ID US