发明名称 TEST DESIGN ASSISTANCE DEVICE, TEST DESIGN ASSISTANCE METHOD, AND COMPUTER-READABLE MEDIUM
摘要 A test design assistance device 10 generates path information indicating a transition path based on a transition event with a designated state as a starting point in a state transition diagram in which the transition event transitioning from one state to the same or another state is described, sets each transition event included in the path information to a factor and sets a type of the transition event to a level, allocates sets of the set factors and levels to a matrix having a designated size, extracts a combination that does not appear in any row of the matrix to which the sets are allocated, among combinations pertaining to all levels between any plurality of factors included within a designated distance in the path information, and adds a row including the extracted combination to the matrix to thereby generate a test matrix.
申请公布号 US2015317241(A1) 申请公布日期 2015.11.05
申请号 US201514796087 申请日期 2015.07.10
申请人 FUJI XEROX CO., LTD. 发明人 AKIYAMA Koichi
分类号 G06F11/36 主分类号 G06F11/36
代理机构 代理人
主权项 1. A test design assistance device comprising: a first generation unit that generates path information indicating a transition path based on a transition event with a designated state as a starting point in a state transition diagram in which the transition event transitioning from one state to the same or another state is described; a first setting unit that sets each transition event included in the path information to a factor and sets a type of the transition event to a level; an allocation unit that allocates sets of the set factors and levels to a matrix having a designated size; an extraction unit that extracts a combination that does not appear in any row of the matrix to which the sets are allocated, among combinations pertaining to all levels between any plurality of factors included within a designated distance in the path information; and a second generation unit that adds a row including the extracted combination to the matrix to thereby generate a test matrix.
地址 Tokyo JP