发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
Provided are a semiconductor device and a method of manufacturing the same. An example device may include: a fin formed on a substrate; a gate stack formed on the substrate and intersecting the fin, wherein the gate stack is isolated from the substrate by an isolation layer, and a Punch-Through Stopper (PTS) formed under the fin, including a first section directly under a portion of the fin where the fin intersects the gate stack and second sections on opposite sides of the first section, wherein the second sections each have a doping concentration lower than that of the first section. |
申请公布号 |
US2015318397(A1) |
申请公布日期 |
2015.11.05 |
申请号 |
US201514797767 |
申请日期 |
2015.07.13 |
申请人 |
Institute of Microelectronics, Chinese Academy of Sciences |
发明人 |
ZHU Huilong |
分类号 |
H01L29/78;H01L29/66;H01L21/02;H01L29/10;H01L29/06;H01L21/308;H01L29/165;H01L21/265 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a semiconductor device, comprising:
forming a fin structure on a substrate; forming an isolation layer on the substrate, wherein the isolation layer exposes a portion of the fin structure, which serves as a fin for the semiconductor device; performing first ion implantation to form a Punch-Through Stopper (PTS) under the fin; forming a gate stack intersecting the fin structure on the isolation layer; and performing second ion implantation to compensate for the PTS. |
地址 |
Beijing CN |