发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 Provided are a semiconductor device and a method of manufacturing the same. An example device may include: a fin formed on a substrate; a gate stack formed on the substrate and intersecting the fin, wherein the gate stack is isolated from the substrate by an isolation layer, and a Punch-Through Stopper (PTS) formed under the fin, including a first section directly under a portion of the fin where the fin intersects the gate stack and second sections on opposite sides of the first section, wherein the second sections each have a doping concentration lower than that of the first section.
申请公布号 US2015318397(A1) 申请公布日期 2015.11.05
申请号 US201514797767 申请日期 2015.07.13
申请人 Institute of Microelectronics, Chinese Academy of Sciences 发明人 ZHU Huilong
分类号 H01L29/78;H01L29/66;H01L21/02;H01L29/10;H01L29/06;H01L21/308;H01L29/165;H01L21/265 主分类号 H01L29/78
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, comprising: forming a fin structure on a substrate; forming an isolation layer on the substrate, wherein the isolation layer exposes a portion of the fin structure, which serves as a fin for the semiconductor device; performing first ion implantation to form a Punch-Through Stopper (PTS) under the fin; forming a gate stack intersecting the fin structure on the isolation layer; and performing second ion implantation to compensate for the PTS.
地址 Beijing CN