发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
A semiconductor device and a method of fabricating the same are provided. The semiconductor device includes a semiconductor substrate in which a word line region is formed, and a barrier metal layer arranged on the word line region and causing a Schottky junction. The barrier metal layer includes a first nitride material, in which a first material is nitrified, and a second nitride material, in which a second material is nitrified. The barrier metal layer is formed of a mixture of the first nitride material and the second nitride material. At least one of the first material or the second material is rich in a metal used to form the first nitride material or the second nitride material. |
申请公布号 |
US2015318329(A1) |
申请公布日期 |
2015.11.05 |
申请号 |
US201514799099 |
申请日期 |
2015.07.14 |
申请人 |
SK hynix Inc. |
发明人 |
KIM Jin Hyock;LEE Keun;KWON Young Seok |
分类号 |
H01L27/24;H01L29/47;H01L29/872 |
主分类号 |
H01L27/24 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a semiconductor substrate in which a word line region is formed; and a barrier metal layer, formed of a metal nitride, arranged on the word line region and causing a Schottky junction, the barrier metal layer including:
a first nitride material formed of a nitrified first material; anda second nitride material formed of a nitrified second material, wherein the barrier metal layer is formed of a mixture of the first nitride material and the second nitride material, and where any one of the first material or the second material is rich in a metal used to form the metal nitride. |
地址 |
Gyeonggi-do KR |