发明名称 |
SIC SCHOTTKY BARRIER DIODE USING TILT ION IMPLANTATION AND METHOD FOR MANUFACTURING THEREOF |
摘要 |
The present invention relates to a silicon carbide Schottky barrier diode using a tilt ion implantation and a manufacturing method thereof. The method for manufacturing the silicon carbide Schottky barrier diode includes the steps of: forming a trench structure by etching an N-type epi-layer after the N-type epi-layer is grown on an N-type SiC substrate; forming an N+ doping layer on the wall of one side of the trench structure; insulating the remaining part of the trench structure with a nonconductor; and depositing a field plate using a metal thin film on the upper region of the nonconductor exposed through the trench structure and the N-type epi-layer. |
申请公布号 |
KR20150123526(A) |
申请公布日期 |
2015.11.04 |
申请号 |
KR20140049999 |
申请日期 |
2014.04.25 |
申请人 |
SOGANG UNIVERSITY RESEARCH FOUNDATION |
发明人 |
KIM, KWANG SOO;SONG, GIL YONG |
分类号 |
H01L29/872;H01L21/265 |
主分类号 |
H01L29/872 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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