发明名称 Devices and methods for analyzing spatter generating events
摘要 A method for monitoring a spatter generating event during a welding application. The method includes capturing data that corresponds to a welding current of the welding application. The method also includes detecting parameters associated with a short circuit from the captured data. The method includes analyzing the detected parameters to monitor the spatter generating event during the welding application.
申请公布号 US9174294(B2) 申请公布日期 2015.11.03
申请号 US201213436673 申请日期 2012.03.30
申请人 ILLINOIS TOOL WORKS INC. 发明人 Hutchison Richard Martin;Holverson Todd Earl;Uecker James Lee
分类号 B23K9/095;B23K31/12 主分类号 B23K9/095
代理机构 Fletcher Yoder P.C. 代理人 Fletcher Yoder P.C.
主权项 1. A method for monitoring a spatter generating event during a welding application comprising: capturing data that corresponds to a welding current of the welding application; detecting parameters associated with a short circuit from the captured data, comprising detecting a duration of the short circuit and a short circuit current; analyzing the detected parameters to monitor the spatter generating event during the welding application, comprising determining whether the duration of the short circuit is greater than a threshold time period and determining whether the short circuit current is greater than a threshold current; and communicating to a user an occurrence of the spatter generating event.
地址 Glenview IL US