发明名称 |
Devices and methods for analyzing spatter generating events |
摘要 |
A method for monitoring a spatter generating event during a welding application. The method includes capturing data that corresponds to a welding current of the welding application. The method also includes detecting parameters associated with a short circuit from the captured data. The method includes analyzing the detected parameters to monitor the spatter generating event during the welding application. |
申请公布号 |
US9174294(B2) |
申请公布日期 |
2015.11.03 |
申请号 |
US201213436673 |
申请日期 |
2012.03.30 |
申请人 |
ILLINOIS TOOL WORKS INC. |
发明人 |
Hutchison Richard Martin;Holverson Todd Earl;Uecker James Lee |
分类号 |
B23K9/095;B23K31/12 |
主分类号 |
B23K9/095 |
代理机构 |
Fletcher Yoder P.C. |
代理人 |
Fletcher Yoder P.C. |
主权项 |
1. A method for monitoring a spatter generating event during a welding application comprising:
capturing data that corresponds to a welding current of the welding application; detecting parameters associated with a short circuit from the captured data, comprising detecting a duration of the short circuit and a short circuit current; analyzing the detected parameters to monitor the spatter generating event during the welding application, comprising determining whether the duration of the short circuit is greater than a threshold time period and determining whether the short circuit current is greater than a threshold current; and communicating to a user an occurrence of the spatter generating event. |
地址 |
Glenview IL US |