发明名称 Image recording apparatus, and method and recording medium for optimizing defective-recording-element compensation parameter
摘要 In the optimization of a non-discharge correction parameter for correcting a non-discharge using a non-discharge correction nozzle, a first test chart including a non-recording region that is the recording position of the non-discharge correction nozzle, a measurement chart region where a measurement chart is formed, and a uniform concentration region is formed for a designated nozzle that is previously designated. Then, the first test chart is read, the reading data is analyzed, the concentration at the measurement chart and the concentration at the uniform concentration region are compared for each non-discharge correction parameter, and a non-discharge correction parameter corresponding to the concentration at the measurement chart that minimizes the concentration difference from the uniform concentration region is derived as the optimum value of the non-discharge correction parameter for the designated nozzle.
申请公布号 US9174475(B2) 申请公布日期 2015.11.03
申请号 US201414467443 申请日期 2014.08.25
申请人 FUJIFILM Corporation 发明人 Ueshima Masashi
分类号 B41J29/393;B41J2/165 主分类号 B41J29/393
代理机构 Studebaker & Brackett PC 代理人 Studebaker & Brackett PC
主权项 1. An image recording apparatus comprising: a defective-recording-element compensation parameter optimizing apparatus that optimizes a defective-recording-element compensation parameter, the defective-recording-element compensation parameter being applied to an image recording that uses a recording head including a plurality of recording elements and being applied to a defect-compensation recording element when a recording defect by a defective recording element is compensated by using the defect-compensation recording element, the defective recording element having become unable to perform a normal recording, the defect-compensation recording element being other than the defective recording element; a forming device which forms a first test chart having a non-recording region, a measurement chart region and a uniform concentration region, the non-recording region being a region where a non-recording is provided at a recording position of a designated recording element previously designated or a region where a non-recording is provided at a recording position of a defective recording element for which the designated recording element compensates the recording defect, the measurement chart region being a region where a measurement chart to which a plurality of defective-recording-element compensation parameters are continuously or intermittently given is formed at a recording position of a defect-compensation recording element that compensates the recording defect at the non-recording region, the uniform concentration region being a region where a uniform concentration image with a processing target concentration is recorded; and a reading device which reads the formed first test chart, wherein the defective-recording-element compensation parameter optimizing apparatus comprises an analyzing device which analyzes reading data obtained by the reading device, which compares a concentration at the measurement chart with the concentration at the uniform concentration region for each defective-recording-element compensation parameter, and which, as an optimum value of the defective-recording-element compensation parameter for the designated recording element, derives a defective-recording-element compensation parameter corresponding to a concentration at the measurement chart that minimizes a concentration difference from the uniform concentration region, wherein, when an optimizing process of the defective-recording-element compensation parameter for the designated recording element is executed multiple times, the forming device narrows a range of the plurality of the defective-recording-element compensation parameters to be applied to the measurement chart relative to the last time, and then forms the measurement chart, the optimizing process including processes by the forming device, the reading device and the analyzing device.
地址 Tokyo JP